SuPReX (Superlattice Refinement from X-Ray Diffreaction)
SUPREX is a program based on a nonlinear fitting algorithm to fit the entire X-ray diffraction profile that allows to qualitative determine both lattice constants and disorder parameters (like roughness) of a wide variety of superlattices. To learn more, view examples and request to download, click here.
MIST (Microscopy Image Segmentation Tool)
MIST is a robust package for segmentation and analysis of porous materials, nanodots, and other repeating structures. To learn more and request to download, click here.